Yizhou Wei research focuses on the development and application of cryogenic microwave impedance microscopy (MIM) to investigate the intrinsic properties of two-dimensional (2D) materials. By operating at ultra-low temperatures, this advanced technique allows for high-resolution mapping of local electrical conductivity and dielectric constants without the interference of thermal noise. He utilises this nanoscale characterisation method to explore fundamental quantum phenomena and charge dynamics in 2D heterostructures, providing crucial insights for the optimisation of next-generation quantum sensing and nanoelectronic devices.