Dr. Xiangbin Cai is currently the presidential postdoctoral fellow in Nanyang Technological University, Singapore. Starting from crystallography and electron microscopy in Zhejiang University, China (2014-2016), his research focuses on the materials interface science from the perspective of structure-property correlations, which scope is enriched with electronics in Hong Kong University of Science and Technology, Hong Kong (2016-2022) and optoelectronics in Nanyang Technological University, Singapore (2022-present). He has received several honors, i.e. University of Alberta Research Award (2015), Hong Kong PhD Fellowship (2016), Postgraduate Research Excellence Award (2019), Microscopy & Microanalysis Scholar Award (2020) and Presidential Postdoctoral Fellowship (2023), and published a number of articles in reputable journals.