Dr Xiangbin Cai is currently a presidential postdoctoral fellow at Nanyang Technological University, Singapore. His research journey began with a focus on crystallography and electron microscopy at Zhejiang University, China (2014–2016). Over time, his work has evolved to explore materials interface science through the lens of structure–property correlations. This scope has been further enriched by his research in electronics at HKUST (2016–2022) and in optoelectronics at NTU (2022–present). Dr Cai has received several honors, including the University of Alberta Research Award (2015), the Hong Kong PhD Fellowship (2016), the Postgraduate Research Excellence Award (2019), the Microscopy & Microanalysis Scholar Award (2020), and the Presidential Postdoctoral Fellowship (2023). He has published numerous articles in reputable scientific journals.